Method for Expanding the Object Base of Examination by Stitching Solutions of Hierarchy Analysis Method

The paper presents the results on numerical modelling of the quality of opto-electronic detectors. In order to demonstrate a successful application of the proposed method of the object base extension, we use examples of hierarchy analysis of generalized quality index and integrated quality-price index. The proposed methodology allows reliable analysis the number of objects up to 21-24, that is enough for the most practical cases of examination.

Keywords

hierarchy analysis method; optoelectronic detectors; quality index.

References

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